1.

Datos Generales: Nombre: Iouri Koudriavtsev , Edad: 43 aos Lugar de nacimiento: Belgorod, Rusia Escolaridad: 1983 - 1989 Leningrad Politechnical Institute, Leningrad (S-Petersburg), Russia, Radio-Physics Faculty, Physical Electronics Department. Specialty: Surface Analysis using ion and electron beams. M.Sc. in Physical Electronics, Feb. 1989, Thesis: "SIMS study of YBaCuO ceramics." 1992 - 1996 St.Petersburg State Technical University, S-Petersburg, Russia. Radio Physics Faculty, Dep. Of Applied Physics and Optics of Solids. Graduate course. Specialty: Ion sputtering of AIIIBV Semiconductors. Ph.D. in the Physical Electronics, Feb. 1998, Thesis: "Secondary neutrals emission from AIIIBV semiconductors under low energy ion bombardment." Experiencia profesional: April 2001 - Presente Investigador, categora: Investigador Cinvestav 3, Ingenieria Electrica - SEES, CINVESTAVIPN, Mexico. Oct., 2000 - April 2001 Research Fellow, Brigham Women's Hospital, Harvard Medical School, Boston, USA Febr.,1999 Oct.,2000 Investigador, categora: Investigador Cinvestav 3A, Ingenieria Electrica - SEES, CINVESTAV-IPN, Mexico. 1996 - Jan., 1999 Investigator, Ioffe Physico-Technical Institute, St.Petersburg, Russia 1994 - 1996 Investigator, Mekhanobr-Analyt Co. St.Petersburg, Russia 1990-1994 Junior Investigator, Research Center, "Mekhanobr" Institute, Leningrad, Russia 1989-1990 Technology Engineer, Microelectronics Center, Ulyanovsk, Russia Posicin y categora actuales: Investigador, categora: Investigador Cinvestav 3A, miembro del SNI, Nivel II Dep. Ingeniera Elctrica - SEES, CINVESTAV-IPN, Mxico DF. 2. Productos de Investigacin o Desarrollo: 2.1 Artculos originales de investigacin: 70 artculos publicados en revistas internacionales indizados, con ms de 4 citas por artculo. Artculos ms relevantes: 1) Yu.Kudriavtsev, Maximum concentration of implanted projectiles during ion sputtering of a sample surface, Nucl. Instrum and Method B160 (2000), pp.307-310 2) A.Villegas, Yu. Kudriavtsev, A.Godines, R. Asomoza, Work function change caused by alkali ion sputtering, Appl. Surf. Sci., V.203-204, (2003) p.94-97 2) Yu. Kudriavtsev, A.Villegas, A.Godines, R.Asomoza, Emission of CsM+ clusters, Appl. Surf. Sci., V. 206, (2003) p. 187-195 3)J.A. Godines, A.Villegas, Yu.Kudriavtsev, R.Asomoza, A.Morales-Acevedo, A.Escamilla,G.Arriaga, H.Hernandes-Contreras, G.Contreras-Puente, J.Vidal, M.Chavarria, R.Fragoso-Soriano, Comparative SIMS analysis of solar cell structures grown by pulsed laser ablation and ion sputtering, Semicond.Sci.Technol.,19 (2004), p. 213-218 4) Yu.Kudriavtsev, A.Villegas, A.Godines, R. Asomoza, Calculation of the surface binding energy of particles, sputtered from a solid, Appl.Surf.Sci.239,(2005), pp. 273-278 5) Yu.Kudriavtsev, A.Villegas, A.Godines, R. Asomoza, SIMS ANALYSIS OF RESIDUAL GAS ELEMENTS WITH A CAMECA IMS-6F ION MICROPROBE, Appl. Surf. Sci., V.252, N10, (2006), pp.3406-3412 6) Yu.Kudriavtsev, A.Villegas, S.Gallardo, R. Asomoza Probability of ionization of sputtered particles as a function of their energy Part I: Negative Si ions Appl. Surf. Sci., 254 (2008), pp. 2059-2066 7) Yu.Kudriavtsev, A.Villegas, S.Gallardo, G.Ramirez, R. Asomoza, Probability of ionization of sputtered particles as a function of their energy Part II: Positive Si+ ions Appl. Surf. Sci., 254 (2008), pp. 3801-3807

8) Yuriy Kudriavtsev, Rene Asomoza, Collision cascade temperature, Nuclear Instruments and Methods in Physics Research B 266 (2008), pp. 3540354 9) Y. Kudriavtsev, S.Gallardo, A.Villegas, G.Ramirez, and R.Asomoza, DepthProfiling analysis of Nanostructures by SIMS: Depth Resolution Function, Bulletin of the Russian Academy of Sciences: Physics, 2008, Vol.72, N7, pp. 895-898 10) Y. Kudriavtsev, S. Gallardo, A. Villegas, G. Ramirez, R. Asomoza, Critical distance for secondary ion formation: Experimental SIMS measurements, Applied Surface Science, V 255 (2008), pp. 877 879 11) Yu. Kudriavtsev and R. Asomoza, Refined Statistical Model of Secondary Ion Formation, Technical Physics, 2009, Vol. 54, No. 11, pp. 15661570 2.1 c Publicados en extenso en memorias de congresos internacionales: 22 artculos publicados. 2.1 g Resmenes de Participacin en Congresos Nacionales e Internacionales: 62 presentaciones orales y de psteres desde ano 1999. 3. Formacin de Recursos Humanos. Curso de propedutica: Fsica Moderna (ano 2004, 2008) Curso de Maestra: Fsica Analtica (ano 2005, 2008, 2009) Direccin de Tesis de Maestra. Estudiante: Salvado Gallardo Hernndez, Examen de Tesis: Oct. 2006 Direccin de Tesis Doctorado: Estudiante: Salvado Gallardo Hernndez, Examen de Tesis: Oct. 2009 4. Proyectos Cientficos (de CONACYT): 1) Study of Secondary Ion Yield as a function of the chemical composition and the work function of the analyzed surface, de 06/2004 a 06/2007, responsible tecnico 2) Investigacin de aleaciones semiconductoras silicio germanio obtenidas por plasma, y nuevas estructuras para micro-bolometros no enfriadas con implementacin y desarrollo de mtodos analticos avanzados basados en SIMS, de 09/2006 a 09/2009, co-responsible tecnico 3) CONSTRUCCIN DE UN INSTRUMENTO COMBINADO Y ESTUDIO DE LOS MTODOS SIMS/EDX COMO COMPLEMENTO PARA ANALISIS QUMICO CUANTITATIVO DE DIVERSOS MATERIALES SLIDOS Y PELICULAS DELGADAS, de 09/2008 a 09/2011, responsible tecnico