SEM06 J01_F60

. .
Equipo en prueba - Ajustes del dispositivo
. . .
Subestación/Bahía:
Subestación: SEM-03 Dirección de subestación: MINA
Bahía: INCOMING 23KV Dirección de bahía: MINA
. . .
Dispositivo:
Nombre/descripción: T60 Fabricante: GENERAL ELECTRIC
Tipo de dispositivo: Rele de Protección Dirección del dispositivo: SEM-06
No de serie:
Info adicional 1:
Info adicional 2:

Hardware Configuration
.
Equipo en prueba
Tipo No de serie
CMC256plus

. .
Comprobación del hardware
Realizado en Resultado Detalles
No se ha realizado
todavía

QuickCMC:
. .
Módulo de prueba
Nombre: OMICRON QuickCMC Versión: 4.31
Comienzo: 04-oct.-2023 07:56:45 Fin:
Nombre de usuario: Administrador:
Compañía:

Resultados de la prueba
Resumen
0 pruebas correctas, 0 pruebas incorrectas, 0 pruebas no
evaluadas
¡No hay resultados disponibles!
Prueba efectuada en modo de simulación: ¡Los resultados
son simulados!

51P (23kV) Arranque RS:

Ajustes de la prueba

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 SEM06 J01_F60
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General
Nº de estados de 1
rampa:
Pasos totales por 101
prueba:
Tiempo total por prueba: 25.250
Nº de ejecuciones de 1
prueba:

Modo de entrada: Directo

Tipo de falta:

Magnitudes en rampa
I L1; L2 / Magnitud
.
Estados de rampa
Rampa Rampa 1
I L1 900.0 mA
0.00 °
60.000 Hz
I L2 900.0 mA
-180.00 °
60.000 Hz
I L3 0.00 A
-240.00 °
60.000 Hz
Forzar fases abs. Sí
Señ. 1 Desde 900.0 mA
Señ. 1 Hasta 1.000 A
Señ. 1 Delta 1.000 mA
Señ. 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt por paso 250.0 ms
Pasos de rampa 101
Tiempo de rampa 25.250s
Trigger Bin
Lógica del trigger OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Paso atrás No
Tiempo de retardo 0.00 s

. .
Módulo de prueba
Nombre: OMICRON Ramping Versión: 4.31
Comienzo: 17-set.-2023 10:18:59 Fin: 17-set.-2023 10:19:13
Nombre de usuario: Julio Flores Administrador:
Compañía: MMG

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 SEM06 J01_F60
Resultados de la evaluación
Nombre / ejec. Rampa Condición Señ. Nom. Real Tol.- Tol.+ Desv. Eval. treal
Arranque 51P Rampa 1 Entr.bi. 1 0->1 I L1, L2 945.0 mA 947.0 mA 141.8 mA 141.8 mA 2.000 mA + 34.90 ms
RS
Eval.: + .. Correcto x .. Incorrecto o .. No evaluado
.

.
Estado de la
prueba:
Prueba correcta

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 0.000 A
0.00 °
60.000 Hz
I L2 900.0 mA
-120.00 °
60.000 Hz
I L3 900.0 mA
60.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s

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 SEM06 J01_F60
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:19:16 Test End: 17-sep-2023 10:19:30
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L2, L3 945.0 mA 947.0 mA 141.8 mA 141.8 mA 2.000 mA + 19.80 ms
ST
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3, L1 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 900.0 mA
-60.00 °
60.000 Hz
I L2 0.000 A
-120.00 °
60.000 Hz
I L3 900.0 mA
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0

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 SEM06 J01_F60
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:19:33 Test End: 17-sep-2023 10:19:47
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L3, L1 945.0 mA 947.0 mA 141.8 mA 141.8 mA 2.000 mA + 33.30 ms
TR
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 900.0 mA
0.00 °
60.000 Hz
I L2 900.0 mA
-120.00 °
60.000 Hz
I L3 900.0 mA
-240.00 °

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 SEM06 J01_F60
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:19:50 Test End: 17-sep-2023 10:20:03
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2, 945.0 mA 947.0 mA 141.8 mA 141.8 mA 2.000 mA + 36.20 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1071
Total time per test: 107.100
No. of test executions: 1

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 SEM06 J01_F60
Input Mode: Direct
Fault Type:

Ramped Quantities
I L1, L2 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.930 A
0.00 °
60.000 Hz
I L2 7.930 A
-180.00 °
60.000 Hz
I L3 0.000 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.930 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 10.00 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 100.0 ms
Ramp Steps 1071
Ramp Time 107.100s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:20:07 Test End: 17-sep-2023 10:20:09
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2 8.000 A 7.930 A 141.8 mA 141.8 mA -70.00 mA + 22.50 ms
RS
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1

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 SEM06 J01_F60
Total steps per test: 1301
Total time per test: 325.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 0.000 A
0.00 °
60.000 Hz
I L2 7.700 A
-120.00 °
60.000 Hz
I L3 7.700 A
60.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.700 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1301
Ramp Time 325.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:21:26 Test End: 17-sep-2023 10:22:44
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact

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 SEM06 J01_F60
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L2, L3 8.000 A 8.001 A 141.8 mA 141.8 mA 1.000 mA + 26.90 ms
ST
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

Test Settings

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 SEM06 J01_F60
.
General
No. of ramp states: 1
Total steps per test: 1201
Total time per test: 300.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3, L1 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.800 A
-60.00 °
60.000 Hz
I L2 0.000 A
-120.00 °
60.000 Hz
I L3 7.800 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.800 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1201
Ramp Time 300.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:22:47 Test End: 17-sep-2023 10:23:39
User Name: Julio Flores Manager:
Company: MMG

Test Results

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 SEM06 J01_F60
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L3, L1 8.000 A 8.001 A 141.8 mA 141.8 mA 1.000 mA + 9.500 ms
TR
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

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 SEM06 J01_F60

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1301
Total time per test: 325.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.700 A
0.00 °
60.000 Hz
I L2 7.700 A
-120.00 °
60.000 Hz
I L3 7.700 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.700 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1301
Ramp Time 325.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:23:42 Test End: 17-sep-2023 10:24:59
User Name: Julio Flores Manager:

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 SEM06 J01_F60
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2, 8.000 A 8.000 A 141.8 mA 141.8 mA 0.000 A + 57.50 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

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 SEM06 J01_F60

50/51P (23kV) Curva de Operación:

Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes 51P (23KV) IEEE Tab II MI - GE 0.95 Iref 0.14 1.00 Non Directional
Yes 50P (23KV) CEI Tiempo definido 8.00 Iref 0.10 s 1.00 Non Directional
No 51P (7.2KV) IEEE Tab II MI - GE 1.00 Iref 0.14 1.00 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 4.31
Test Start: 17-sep-2023 10:39:38 Test End: 17-sep-2023 10:40:12
User Name: Julio Flores Manager:
Company: MMG

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %

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 SEM06 J01_F60
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a

Binary Inputs:
Trigger Logic: And
Name Trigger State
Entr.bi. 1 1
Entr.bi. 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2 51P (23KV) 1.852 1.750 A n/a 638.6 ms 634.8 ms -0.5887 % No Passed
L1-L2 51P (23KV) 3.175 3.000 A n/a 341.7 ms 347.1 ms 1.570 % No Passed
L1-L2 51P (23KV) 4.497 4.250 A n/a 263.1 ms 275.5 ms 4.703 % No Passed
L1-L2 51P (23KV) 5.820 5.500 A n/a 225.0 ms 247.1 ms 9.840 % No Passed
L1-L2 51P (23KV) 7.143 6.750 A n/a 201.8 ms 216.9 ms 7.491 % No Passed
L1-L2 51P (23KV) 8.466 8.000 A n/a 100.0 ms 200.9 ms 100.9 % No Passed
L1-L2 50P (23KV) 1.162 9.293 A n/a 100.0 ms 128.5 ms 28.50 % No Passed
L2-L3 51P (23KV) 1.852 1.750 A n/a 638.6 ms 634.2 ms -0.6827 % No Passed
L2-L3 51P (23KV) 3.175 3.000 A n/a 341.7 ms 354.2 ms 3.647 % No Passed
L2-L3 51P (23KV) 4.497 4.250 A n/a 263.1 ms 276.8 ms 5.197 % No Passed
L2-L3 51P (23KV) 5.820 5.500 A n/a 225.0 ms 247.2 ms 9.885 % No Passed
L2-L3 51P (23KV) 7.143 6.750 A n/a 201.8 ms 214.5 ms 6.302 % No Passed
L2-L3 51P (23KV) 8.466 8.000 A n/a 100.0 ms 198.5 ms 98.50 % No Passed
L2-L3 50P (23KV) 1.211 9.691 A n/a 100.0 ms 127.9 ms 27.90 % No Passed
L3-L1 51P (23KV) 1.852 1.750 A n/a 638.6 ms 633.9 ms -0.7297 % No Passed
L3-L1 51P (23KV) 3.175 3.000 A n/a 341.7 ms 353.6 ms 3.472 % No Passed
L3-L1 51P (23KV) 4.497 4.250 A n/a 263.1 ms 274.7 ms 4.399 % No Passed
L3-L1 51P (23KV) 5.820 5.500 A n/a 225.0 ms 242.5 ms 7.795 % No Passed
L3-L1 51P (23KV) 7.143 6.750 A n/a 201.8 ms 215.7 ms 6.897 % No Passed
L3-L1 51P (23KV) 8.466 8.000 A n/a 100.0 ms 201.3 ms 101.3 % No Passed
L3-L1 50P (23KV) 1.156 9.250 A n/a 100.0 ms 128.6 ms 28.60 % No Passed
L1-L2-L3 51P (23KV) 1.852 1.750 A n/a 638.6 ms 631.0 ms -1.184 % No Passed
L1-L2-L3 51P (23KV) 3.175 3.000 A n/a 341.7 ms 345.4 ms 1.072 % No Passed
L1-L2-L3 51P (23KV) 4.497 4.250 A n/a 263.1 ms 273.5 ms 3.942 % No Passed
L1-L2-L3 51P (23KV) 5.820 5.500 A n/a 225.0 ms 239.8 ms 6.595 % No Passed
L1-L2-L3 51P (23KV) 7.143 6.750 A n/a 201.8 ms 215.4 ms 6.748 % No Passed
L1-L2-L3 51P (23KV) 8.466 8.000 A n/a 100.0 ms 128.1 ms 28.10 % No Passed
L1-L2-L3 50P (23KV) 1.156 9.250 A n/a 100.0 ms 126.7 ms 26.70 % No Passed
.
Charts for Fault
Types:
Type Angle
L1-L2 n/a

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 SEM06 J01_F60
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L2-L3 n/a
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L3-L1 n/a
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L1-L2-L3 n/a

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 SEM06 J01_F60
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Test State:
28 out of 28 points tested.
28 points passed.
0 points failed.

Test passed

. .
Test Object - Device Settings
. . .
Substation/Bay:
Substation: SEM-03 Substation address: MINA
Bay: INCOMING 23KV Bay address: MINA
. . .
Device:
Name/description: T60 Manufacturer: GENERAL ELECTRIC
Device type: Rele de Protección Device address: SEM-03
Serial/model number: ABHC13001186 / T60-T03-HKH-
F8L-H6E-M8N-P6E-UXX-WXX
Additional info 1:
Additional info 2:

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus RJ811T
. .

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 SEM06 J01_F60
Hardware Check
Performed At Result Details
17/09/2023 10:26:38 Passed
a.m.

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 900.0 mA
0.00 °
60.000 Hz
I L2 900.0 mA
-180.00 °
60.000 Hz
I L3 0.000 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

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. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:26:42 Test End: 17-sep-2023 10:26:55
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2 945.0 mA 946.0 mA 141.8 mA 141.8 mA 1.000 mA + 129.0 ms
RS
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60
.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 0.000 A
0.00 °
60.000 Hz
I L2 900.0 mA
-120.00 °
60.000 Hz
I L3 900.0 mA
60.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X

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 SEM06 J01_F60
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:26:58 Test End: 17-sep-2023 10:27:12
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L2, L3 945.0 mA 947.0 mA 141.8 mA 141.8 mA 2.000 mA + 31.30 ms
ST
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

Test Settings

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 SEM06 J01_F60
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3, L1 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 900.0 mA
-60.00 °
60.000 Hz
I L2 0.000 A
-120.00 °
60.000 Hz
I L3 900.0 mA
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:27:15 Test End: 17-sep-2023 10:27:29
User Name: Julio Flores Manager:
Company: MMG

Test Results

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 SEM06 J01_F60
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L3, L1 945.0 mA 946.0 mA 141.8 mA 141.8 mA 1.000 mA + 86.10 ms
TR
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

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 SEM06 J01_F60

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 25.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 900.0 mA
0.00 °
60.000 Hz
I L2 900.0 mA
-120.00 °
60.000 Hz
I L3 900.0 mA
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 900.0 mA
Sig 1 To 1.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 101
Ramp Time 25.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:27:32 Test End: 17-sep-2023 10:27:45
User Name: Julio Flores Manager:

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 SEM06 J01_F60
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2, 945.0 mA 946.0 mA 141.8 mA 141.8 mA 1.000 mA + 38.60 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:
Test passed

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 SEM06 J01_F60

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1071
Total time per test: 107.100
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.930 A
0.00 °
60.000 Hz
I L2 7.930 A
-180.00 °
60.000 Hz
I L3 0.000 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.930 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 10.00 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 100.0 ms
Ramp Steps 1071
Ramp Time 107.100s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module

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 SEM06 J01_F60
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:28:13 Test End: 17-sep-2023 10:28:22
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2 8.000 A 8.000 A 141.8 mA 141.8 mA 0.000 A + 78.50 ms
RS
Assess: + .. Passed x .. Failed o .. Not assessed

.
Test State:

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 SEM06 J01_F60
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1301
Total time per test: 325.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 0.000 A
0.00 °
60.000 Hz
I L2 7.700 A
-120.00 °
60.000 Hz
I L3 7.700 A
60.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.700 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1301
Ramp Time 325.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

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 SEM06 J01_F60
. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:28:25 Test End: 17-sep-2023 10:29:43
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L2, L3 8.000 A 8.001 A 141.8 mA 141.8 mA 1.000 mA + 30.00 ms
ST
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60
.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1201
Total time per test: 300.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3, L1 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.800 A
-60.00 °
60.000 Hz
I L2 0.000 A
-120.00 °
60.000 Hz
I L3 7.800 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.800 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1201
Ramp Time 300.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X

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 SEM06 J01_F60
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:29:46 Test End: 17-sep-2023 10:30:38
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L3, L1 8.000 A 8.000 A 141.8 mA 141.8 mA 0.000 A + 35.30 ms
TR
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 1
Total steps per test: 1301
Total time per test: 325.250
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1, L2, L3 / Magnitude
.
Ramp States
Ramp Ramp 1
I L1 7.700 A
0.00 °
60.000 Hz
I L2 7.700 A
-120.00 °
60.000 Hz
I L3 7.700 A
-240.00 °
60.000 Hz
Force abs. Phases Yes
Sig 1 From 7.700 A
Sig 1 To 9.000 A
Sig 1 Delta 1.000 mA
Sig 1 d/dt 4.000 mA/s
Sal. bin 1 0
Sal. bin 2 0

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 SEM06 J01_F60
Sal. bin 3 0
Sal. bin 4 0
dt per Step 250.0 ms
Ramp Steps 1301
Ramp Time 325.250s
Trigger Bin
Trigger Logic OR
Entr.bi. 1 1
Entr.bi. 2 X
Entr.bi. 3 X
Entr.bi. 4 X
Entr.bi. 5 X
Entr.bi. 6 X
Entr.bi. 7 X
Entr.bi. 8 X
Entr.bi. 9 X
Entr.bi. 10 X
Step back No
Delay Time 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 17-sep-2023 10:30:41 Test End: 17-sep-2023 10:31:58
User Name: Julio Flores Manager:
Company: MMG

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Arranque 51P Ramp 1 Entr.bi. 1 0->1 I L1, L2, 8.000 A 8.000 A 141.8 mA 141.8 mA 0.000 A + 37.60 ms
RST L3
Assess: + .. Passed x .. Failed o .. Not assessed

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 SEM06 J01_F60

.
Test State:
Test passed

50/51P (23kV) Curva de Operación:

Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes 51P (23KV) IEEE MI 0.95 Iref 0.25 1.00 Non Directional
Yes 50P (23KV) CEI Tiempo definido 8.00 Iref 0.10 s 1.00 Non Directional
No 51P (7.2KV) IEEE MI 1.00 Iref 0.25 1.00 Non Directional

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 SEM06 J01_F60

. .
Test Module
Name: OMICRON Overcurrent Version: 4.31
Test Start: 17-sep-2023 10:36:19 Test End: 17-sep-2023 10:36:59
User Name: Julio Flores Manager:
Company: MMG

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a

Binary Inputs:
Trigger Logic: And
Name Trigger State
Entr.bi. 1 1
Entr.bi. 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2 51P (23KV) 1.852 1.750 A n/a 1.067 s 1.098 s 2.914 % No Passed
L1-L2 51P (23KV) 3.175 3.000 A n/a 579.4 ms 605.6 ms 4.529 % No Passed
L1-L2 51P (23KV) 4.497 4.250 A n/a 450.3 ms 480.3 ms 6.670 % No Passed
L1-L2 51P (23KV) 5.820 5.500 A n/a 387.6 ms 414.1 ms 6.839 % No Passed
L1-L2 51P (23KV) 7.143 6.750 A n/a 349.5 ms 373.8 ms 6.944 % No Passed
L1-L2 50P (23KV) 1.112 8.896 A n/a 100.0 ms 129.0 ms 29.00 % No Passed
L1-L2 50P (23KV) 1.275 10.20 A n/a 100.0 ms 128.2 ms 28.20 % No Passed
L2-L3 51P (23KV) 1.852 1.750 A n/a 1.067 s 1.101 s 3.205 % No Passed
L2-L3 51P (23KV) 3.175 3.000 A n/a 579.4 ms 605.6 ms 4.529 % No Passed
L2-L3 51P (23KV) 4.497 4.250 A n/a 450.3 ms 476.0 ms 5.715 % No Passed
L2-L3 51P (23KV) 5.820 5.500 A n/a 387.6 ms 409.3 ms 5.600 % No Passed
L2-L3 51P (23KV) 7.143 6.750 A n/a 349.5 ms 371.8 ms 6.372 % No Passed
L2-L3 50P (23KV) 1.029 8.233 A n/a 100.0 ms 130.5 ms 30.50 % No Passed
L2-L3 50P (23KV) 1.162 9.293 A n/a 100.0 ms 129.9 ms 29.90 % No Passed
L3-L1 51P (23KV) 1.852 1.750 A n/a 1.067 s 1.101 s 3.243 % No Passed
L3-L1 51P (23KV) 3.175 3.000 A n/a 579.4 ms 602.7 ms 4.029 % No Passed
L3-L1 51P (23KV) 4.497 4.250 A n/a 450.3 ms 479.6 ms 6.515 % No Passed
L3-L1 51P (23KV) 5.820 5.500 A n/a 387.6 ms 412.4 ms 6.400 % No Passed
L3-L1 51P (23KV) 7.143 6.750 A n/a 349.5 ms 375.7 ms 7.488 % No Passed

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 SEM06 J01_F60
L3-L1 51P (23KV) 8.466 8.000 A n/a 100.0 ms 346.7 ms 246.7 % No Passed
L3-L1 50P (23KV) 1.093 8.747 A n/a 100.0 ms 129.2 ms 29.20 % No Passed
L1-L2-L3 51P (23KV) 1.852 1.750 A n/a 1.067 s 1.096 s 2.755 % No Passed
L1-L2-L3 51P (23KV) 3.175 3.000 A n/a 579.4 ms 603.6 ms 4.184 % No Passed
L1-L2-L3 51P (23KV) 4.497 4.250 A n/a 450.3 ms 477.0 ms 5.938 % No Passed
L1-L2-L3 51P (23KV) 5.820 5.500 A n/a 387.6 ms 406.5 ms 4.878 % No Passed
L1-L2-L3 51P (23KV) 7.143 6.750 A n/a 349.5 ms 374.4 ms 7.116 % No Passed
L1-L2-L3 51P (23KV) 8.466 8.000 A n/a 100.0 ms 127.6 ms 27.60 % No Passed
L1-L2-L3 50P (23KV) 1.140 9.122 A n/a 100.0 ms 128.2 ms 28.20 % No Passed
.
Charts for Fault
Types:
Type Angle
L1-L2 n/a
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L2-L3 n/a
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L3-L1 n/a

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 SEM06 J01_F60
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Charts for Fault
Types:
Type Angle
L1-L2-L3 n/a
10000.00

1000.00

100.00
t/s

10.00

1.00

0.10

1.0 2.0 3.0 5.0 7.0 10.0 20.0

I/A

.
Test State:
28 out of 28 points tested.
28 points passed.
0 points failed.

Test passed

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