Testing Solid-State Devices Precautions Qhewmsters - Ontour be remmrrnerad that tha 0h Fmornal voltage source. Also, nome instruments are capable Of Galivering high currents. ‘Yee tat pr wth ser pins facut chcks on printed. sna by pope alain, on ed tte comenent to SS Rew They mc cr cry ary ec at aso ‘Saaytcondyct Ao the new pan any ie danuiying Lean un Uneartod Teariaars — Cecaondy, ‘an cPauts tone t eoauctre, Fane wadgy: — ontiing Lend on Uoparked Trareatore — Gece, os anne a not malig wood comestorn onthe tos iy Me beta wh te ow aerate heck ernie stop, Sa cht tye ween | ‘ore maaurenens a ot risecing cava o he Sochpa ead beth ha Forward and Pinout neta tat become a rte Ha oh a ba our en Eritea ir iometar’ yA eg avown duct frre Soe wt on et re ‘oti acon Tonys ont mr unon ot ho paced actos th entrant for wad ‘Tn omc Siontor Pas aictily pcre Re monet nl Rs {tates the Ye od ww ome that ho ced Fi tear saitanoeresing ‘St 2 date th trltor type. An ohmatr hack is mde ‘eta he Gee omer lu eta foe ‘ares wh the raga sie ofthe her con actos tsa fost Vane wb PME POA fo {Sete adn wh hb ponent oo NPA * foetus ean cad oer ‘iS lea Oe SITE pon re ‘he chsh: Thi oes en nay of hun okie arangerent for ety | Honor ae ‘Ai elatm act he ‘anm — on Th ewe ‘Testing Bipolar Transistors: corm oop i serge ar cat acai nacre hvmen em cage ae knee eet ayy See Sermacm enh amme Eee | Sei ismeer area olny oan tinh: ee aon vt i eer acest rr serene moraine ai a “ demvarse.lmmene semarainen mea genes i go Foray teiegapren arecuied Stes ‘the tou equ Gyan ofrnater The mere wot Sacks hs be modem tt fw baat omponer 11 p, ore eins agua seme uaa etre Tra Vou rand Ya kon ie ths cet te ot cor molirg ronment hs pout othe wpe - 488‘rough but useful check ofthe contin of thejretions may, fa‘me with an obmmetor. Prt, te forward reitancy of each JR's measured a ahown Fig. C19 this figure, the con [elit tore PNP teraistor are shown. The negate terminal, OF the obmmete e comacted tothe base. The forward Sedslance of bom jnctong te cheskea by touching the emiter he thor the ealactor ternal in turn withthe postive ead A gh reading incieetes an open juretion. A normal unit should ‘BB's oosiny below 800 ohms. Otmerve the procactions given ‘Sarr fer using the ohmmater The forward resistance of functors of am NPN urit fs chackad withthe same setup shown ig C,Dut withthe lade to the ohmmcte rvorod. “To check for shorts or excessive lnakago, revere the obmmate oorectons and swites to.a higher resistance scale, 28 shown in Fig. Now the ofmmretr places a reverse Dies on each ne nd estage curant registred onthe mete. A low resstarce mading indicates a shared or leaky junction (eae egomer germanium vansitors should show faaatance reading ofa least 20 bobs. Fig. D, Method of chocking the reverse resistance of both Janetions. “Typical readings taken with an chmmetar cn the Fxt0« sale are Bekiohmre to 1.8 megohms. Shoon transistor ge much Fighotrvstarcs resdinge, Power vanaotore have larger JINe- tions and therfore greta leakage currants, Revers bis Feostavoe readings should be 80 ions o: greater for power Revorso-resietance checks on NPN transistors are made by reve ‘ing the ohrneter leads so they ary opposite f0 that shown in ig B' Note met te act! nurorealreaing iv fre ia moar Frajone, because the ahmmetee an only raasure nest ‘eastatoos, The pectic okmeeadng changes from meter to ‘eer eid ie not te sore for afferent stings ofthe range "The minimum ard raxinun values gen here apB in Vmojorty of coves, To increase fe accuracy of the ofmmeter ie Yeodinge thecld be compared with those ade On 2 (900d traitor ofthe sare tye. Tay a Fig. E. Gain measurement using en ohmametor. Current Gain — Transisor action may be checked with an Shrimeter by means ofthe sotup showin Fig. E. The meter carves tee beore the Soo Kibhen router touched tothe bese, comiecing fe rosstor aoa a smal bese bias to be 8b- Bled, th mer stow cee neuen (eee Fessiance reading) ‘Testing Field Effect Transistors “Testing felt tect devas is semewhat more complicated than [Shiny Bipolars ond must take nto see2ur tho folowing 1 ts te device a JFET oF MOSFET? 2. ts ne FET an r-chonnel or p-channal type? 3: Ifthe device @ MOSFET, le itan enhencement or depletion "eo? 1 not aterot to remove fom the circuit or handle a FET. ‘ness certain thatthe device fea JPET or an naleed- gate protectod MOSFET, The wereatian i eosantal, because an Crinslgtod ote protected MOSFET may be damaged unis braper nenolng secsucone are taker. When ering ot Iaor. fing o removing thi tye ef MOSFET, the folowing should be ‘observed 1. Prieto asombly into a crit, ll lads should be kent Reta aagetver by ther the us of mots shorting stings Sttachod 1 the device by the vendor, or by the use of @ 2on- Sutive foam. Note "eri" ould MOL De use [ecoure incon acquit hgh state charges. 2. When device are removed by hand from tel caries, the fond being uted sheuld be at ground pote. 3, Tips of scdering irons shoud be grounded, 4. Devices should nove be inserted into or removed from t- ats withthe power ‘Tasting the JFET — The forward resistance ofa JFET can be ‘hosted wits low vokage alates, prferbly onthe RxI00 ‘Ele. Connect the postive lead to gated the negative laad 12 Sa aeain ge source, ren n-channel JPET. Reverse the ads i = pProhannel type. ‘To teat tho vere rsistanen of a n-channel JFET. connect the Tegatve led ofthe obmeratot tothe gato and the postive lead ee dam or source, The device shoula show almost nit Feeltance, Lower reacngs incicats athe leskag® ota shor. Fevers the leads to test a p-channel device. ‘Testing the MOSFET — The forward resistance and reverse Testun ean be cece wits ‘Shrametor on the Fight "A" scale, The inulatod-gate MOSFET nas on extremely Nghinput resistance. Henco, we should obtain almost inte raster reac for both forward and revere resistance tos [etmgen gate and drain of sourea. Lower readings inca Hodiionnn ine mavaton between gave snd cin or sourceTesting Diodes Diodes ad Rectifiers — Sgcauns dod and ecto re ‘onamaltyng devies, simple tosis or shor, pers, er ei- sine rsh hoe fey ae le Sning 6 folloning texts anol appease othe Speci Case of ocur doges ars hgh votage ties Rewer. The forward renstares of lode a rote scree Oy sor ‘cing the postive and nogatve lads ofan ohmmete, brofobiy ot to te RxtO0 sca, to the eapeceve postive [snod) dnd negative (cathode) Yorirais. A reading of out ‘30 to Gad ohms normal or sltcan pss, bow 0 te 30) ‘hme for gomantur typos, and for lator fe feces ge ‘ani ofslleon) the Yeatance sovewhet lover that tir ‘omc eyes, Seause nah rotoge yoke nay have Several dines nares, Mager rastance esc canbe or As quick go/no-go tet, te ohrmetar procedure ist dase To chack for shorts of exconsve leskege, sich to a higher fasstance scale and rovers the ofmmete loads. A lw fesstance reading indietes a shor or leaky device, Germanium ‘oder chould chow a feitane reading tom about 100 hihi to} megohm. Slicon dodes show higher rnstanoe regcngs td Can go uD te 1000 megohms: However, some codes Tay ‘Show lower essances but function satfscterly in vome oi ‘ut. Rectifiers, Decnus they general have argerjunctons, ove higher leakego surents, Zenor Diodes ~ To quick determine If Zanes have open, ‘Sorts, or lsatage, connect an ahmmeter fh the foward sre: ‘ion in the some hanner as doesribed for standar odes, Z| osvormeree However, these ts. sthough hulp do sot provide the brio iterator needed fer a Zret dogs, rary the Levies mguating ot saad wast & regen tet oc Comlshed witha metered scusaba power suppy thet preferably ineates tage ard caren ‘Connect the output ofthe power supply through aiming racist in geie with tho Zaner ode tba ttle and sly ‘ease the output voltage und the spectted curent is fowing ‘ough the Zener Igoe Fig. FI Now conmect a voltmet 2705 the Zane to manitar tho fener vntageFusctusts the urent o ther side of the specfod Zoner currant if he Zenor fe porting propery the votage should Tent conan Testing SCRs and TRIACS (Thyristors) ‘The functional esting of SCRS and TRIACS usually requires test sRuloment cali pang fe spectiod gate arnt ig the SCR ard TRIAC sections of hie ‘id ism Pal ee ia given in chart form “Teotng wth an ohmrmmter is nt recommended for hgh current TeySte and ho oni b ua fer tn xno ow sutent Thyisters. The igr and og partes of “Thyitor my excond te ture “Sth pay ofthe oh ‘peter cousin fle reedings and therefore, ray Not akaye ‘Geaw te tue uncton ofthe dence owever, asimole ohraneter test on low power Thyrstors may lovee an spproximate evaistion of thar gate Sang capable Er-connecting an chmmeter as shown in Fp G. The negate. leads connected fo cethode end the postive lead i CoN woanede, Using the Fct scale, short the gate to the anode. A reading of, spormaaty t's ohne rma Not When te ie {ayode short removed. the sme reading shoul ei ‘thereto unt he a ar remored from cathedo or the ‘sods. Now, fecomecting the meter eaes to cathode ana, {ode should show no reading Urtl the gates aga shored to the snoce. Testing of Gate turn off SCRs requires special test equloment, Fel sing of tev SERS i Sou on Spay pom or cg Fo F. Hookup arrangement for teating Zener diodes, Fa. @. Hookup arrangement for testing thytstore with an