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IRLZ24N
HEXFET® Power MOSFET
l Logic-Level Gate Drive
l Advanced Process Technology D
l Dynamic dv/dt Rating VDSS = 55V
l 175°C Operating Temperature
l Fast Switching RDS(on) = 0.06Ω
G
l Fully Avalanche Rated
S
ID = 18A
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve the
lowest possible on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET Power MOSFETs are well
known for, provides the designer with an extremely efficient
device for use in a wide variety of applications.
Thermal Resistance
Parameter Min. Typ. Max. Units
RθJC Junction-to-Case 3.3
RθCS Case-to-Sink, Flat, Greased Surface 0.50 °C/W
RθJA Junction-to-Ambient 62
07/12/02
IRLZ24N
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ.Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 V V GS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient 0.061 V/°C Reference to 25°C, ID = 1mA
0.060 V GS = 10V, ID = 11A
RDS(on) Static Drain-to-Source On-Resistance 0.075 Ω V GS = 5.0V, ID = 11A
0.105 V GS = 4.0V, ID = 9.0A
VGS(th) Gate Threshold Voltage 1.0 2.0 V V DS = V GS, ID = 250µA
gfs Forward Transconductance 8.3 S V DS = 25V, ID = 11A
25 V DS = 55V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
250 V DS = 44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage 100 V GS = 16V
IGSS nA
Gate-to-Source Reverse Leakage -100 V GS = -16V
Qg Total Gate Charge 15 ID = 11A
Qgs Gate-to-Source Charge 3.7 nC V DS = 44V
Qgd Gate-to-Drain ("Miller") Charge 8.5 V GS = 5.0V, See Fig. 6 and 13
td(on) Turn-On Delay Time 7.1 V DD = 28V
tr Rise Time 74 ID = 11A
ns
td(off) Turn-Off Delay Time 20 RG = 12Ω, VGS = 5.0V
tf Fall Time 29 RD = 2.4Ω, See Fig. 10
Between lead, D
LD Internal Drain Inductance 4.5
6mm (0.25in.)
nH
from package G
18
(Body Diode) showing the
A
I SM Pulsed Source Current integral reverse G
72
(Body Diode) p-n junction diode. S
VSD Diode Forward Voltage 1.3 V TJ = 25°C, IS = 11A, VGS = 0V
t rr Reverse Recovery Time 60 90 ns TJ = 25°C, IF = 11A
Q rr Reverse RecoveryCharge 130 200 nC di/dt = 100A/µs
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by ISD ≤ 11A, di/dt ≤ 290A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ ≤ 175°C
VDD = 25V, starting TJ = 25°C, L = 790µH Pulse width ≤ 300µs; duty cycle ≤ 2%.
RG = 25Ω, IAS = 11A. (See Figure 12)
IRLZ24N
2.5V
1 1
2.5V
20µs PULSE WIDTH 20µs PULSE WIDTH
T J = 25°C T J = 175°C
0.1 A 0.1 A
0.1 1 10 100 0.1 1 10 100
VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V)
100 3.0
I D = 18A
R DS(on) , Drain-to-Source On Resistance
TJ = 25°C
I D , Drain-to-Source Current (A)
2.5
TJ = 175°C
10 2.0
(Normalized)
1.5
1 1.0
0.5
V DS = 15V
20µs PULSE WIDTH VGS = 10V
0.1 0.0 A
A
2 3 4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
800 15
V GS = 0V, f = 1MHz I D = 11A
C iss = Cgs + C gd , Cds SHORTED V DS = 44V
400
Coss
6
200
Crss 3
100 1000
OPERATION IN THIS AREA LIMITED
BY R DS(on)
ISD , Reverse Drain Current (A)
100
TJ = 175°C
TJ = 25°C 10µs
10
10 100µs
TC = 25°C 1ms
TJ = 175°C
VGS = 0V Single Pulse 10ms
1 A 1 A
0.4 0.8 1.2 1.6 2.0 1 10 100
VSD , Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V)
20
RD
VDS
V GS
16 D.U.T.
ID, Drain Current (Amps)
RG
+
-V DD
12
5.0V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
8
0 A
25 50 75 100 125 150 175
TC , Case Temperature (°C)
10%
VGS
Fig 9. Maximum Drain Current Vs. td(on) tr t d(off) tf
Case Temperature
Fig 10b. Switching Time Waveforms
10
Thermal Response (ZthJC )
D = 0.50
1
0.20
0.10
0.05
0.02 PDM
0.01
0.1
SINGLE PULSE t
1
(THERMAL RESPONSE)
t2
Notes:
1. Duty factor D = t /t
1 2
2. Peak TJ = PDM x Z thJC + T C
0.01 A
0.00001 0.0001 0.001 0.01 0.1 1
140
L ID
5.0 V IAS 80
tp
0.01Ω
60
20
VDD = 25V
V(BR)DSS 0 A
25 50 75 100 125 150 175
VDD
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
VDS
IAS
50KΩ
12V .2µF
QG .3µF
5.0 V +
V
D.U.T. - DS
QGS QGD
VGS
VG
3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRLZ24N
+
- +
-
RG • dv/dt controlled by RG +
• Driver same type as D.U.T. VDD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
VGS=10V *
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% ISD
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 07/02
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/