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Overview
RF instruments have several specifications that characterize the performance of the instrument. With constant changes in wireless technologies, engineers may need to routinely design RF
components and devices, that they may not be adequately experienced in. This three-part article is designed to help you understand basic and advanced RF instrument specifications. The articles
cover generic generator and analyzer specifications. Part 1 describes specifications such as frequency range, instantaneous bandwidth, tuning speed, phase noise, and voltage standing wave
ratio. Parts 2 and 3 describe 1 dB compression point, third-order intercept, dynamic range, and resolution bandwidth.
The articles in this series are divided into the following parts.
Part 1: General RF Instrument Specifications
Part 2: RF Signal Generator Specifications
Part 3: RF Signal Analyzer Specifications
Table of Contents
1. Introduction
2. Frequency Range
3. Instantaneous (Real-Time) Bandwidth
4. Tuning Speed
5. Phase Noise
6. Voltage Standing Wave Ratio (VSWR)
7. Conclusion
8. Related Links
1. Introduction
This article describes the specifications listed below. These specifications are applicable to both RF generation and analysis.
Frequency range
Instantaneous (Real-Time) bandwidth
Tuning speed
Phase noise
Voltage standing wave ratio (VSWR)
Note: All RF devices are subject to the same design rules as RF instrumentation.
2. Frequency Range
Frequency range is an important characteristic of an RF instrument. For example, a WiFi test solution requires operation at frequencies of up to 2.5 GHz. Similarly, while performing the analysis of
a component that operates at 900 MHz the instrument that uses this component must operate at that frequency range to be useful. A number of components, such as mixers, input filters, and local
oscillators (LOs), can affect the maximum frequency range of an RF instrument. However, the instrument is configured to work at a specific frequency mainly by tuning the LO. Some instruments
use a series of LOs, but the simplified instrument block diagram, shown in Figure 2, uses a single LO.
Figure 2. Instantaneous Bandwidth is Determined by the Filter and Analog-to-Digital Converter (ADC)
In Figure 2, the vector signal analyzer downconverts a portion of the RF spectrum to an IF that an ADC can recognize. The instantaneous bandwidth of an RF instrument is determined by the
following two main components:
Filters implemented in the instrument
Sample rate and bandwidth of the ADC
The relative importance of the instantaneous bandwidth of an instrument is largely dependent on the application. For example, generating a narrow-band FM signal requires only 200 kHz
instantaneous bandwidth. However, generating and analyzing wide-band signals, such as the IEEE Standard 802.11g (WiFi), requires at least 20 MHz of instantaneous bandwidth. Other
applications, such as spectral mask testing, perform faster when the instantaneous bandwidth is significantly wider than the signal of interest. If the spectral mask test requires more instantaneous
bandwidth than what the instrument provides, you must re-tune the instrument to acquire the frequency information in sections.
4. Tuning Speed
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Tuning speed measures the amount of time required for the LO to change from one center frequency to another within a specified accuracy level. When tuning an oscillator to a different frequency,
the LO settling time dictates the tuning speed.
In typical systems, when tuning from one frequency to another, the LO usually slightly overshoots the desired frequency, and then settles to the desired frequency within a certain time period. In
most cases, the tuning speed is a function of the frequency step size. The greater the frequency step, the longer it takes the LO to tune within a specified range. Table 1 illustrates the settling time
for a YIG-based LO.
Table 1. Tuning Speed of YIG-Based LO
Tuning speed is an important specification in applications such as an 802.11g transceiver automated production test. Because the 802.11g standard specifies that devices must function at one of
the 14 channels between 2.4 GHz and 2.48 GHz, RF instruments must be used to test device operation across a variety of frequencies. The quicker the test signal sweeps from one station to the
next, the quicker the receiver is tested.
5. Phase Noise
Phase noise describes the short-term frequency stability of an RF instrument. Phase noise is caused by small, instantaneous LO phase jitter and results in signal power at frequencies adjacent to
the carrier.
A simple way to visualize the effects of phase noise is to analyze a single tone in the frequency domain. Figure 3 represents two simulated carriers, an ideal carrier and a carrier with phase noise.
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Because VSWR is also dependent on material properties, its value can be calculated based on a reflection coefficient, , as shown in the following equation:
VSWR substantially affects a test signal because it causes adjustments in the phase or amplitude of the signal. Moreover, the generated signal amplitude either increases or decreases depending
on the VSWR reflection phase. Figure 6 illustrates how VSWR reflections affect signal amplitude.
7. Conclusion
Understanding RF Instrument Specifications Part 1 provides basic information about some of the RF specifications. Note that many of the specifications apply to all RF devices and not just to
instruments. You may encounter some of the same specifications in your own designs. The next article in this three-part series explains the specifications that are used to characterize RF
generators such as frequency tolerance, linearity, power output, 1 dB compression point, and third-order intercept.
Refer to the National Instruments RF Developer Network for more information about making RF measurements.
Request your free RF and Microwave Reference Poster
8. Related Links
Understanding RF & Microwave Specifications - Part I
Wireless & Networking DesignLine
Understanding RF Instrument Specifications Part 1 in RF DesignLine
NI RF Developer's Network
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