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Documentos de Profesional
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Product: Date:
No. Inspected Lot no.
Inspector’s name
Type of defect Number of Total
Check Sheet
Cracks 7
Scratch
Blowholes
Dimension
Surface finish
HISTOGRAMS
USL
LSL
Freque
ncy
Diameter
SCATTER DIAGRAMS
EXAMPLES:
POSITIVE CORRELATION -
OVERTIME VS ERRORS
HEIGHT VS WEIGHT
NEGATIVE CORRELATION-
EXTERNAL TEMPERATURE VS GAS BILL
QUALITY VS CUSTOMER COMPLAINTS
NO CORRELATION
HEIGHT VS MARKS IN BOARD EXAMS
Scatter Diagrams
Positive
Correlation
Scatter Diagram .. ..
.. .. ..
.. . . ..
…
..
%
..
..
defective
…
.
. . .. .. .. .. ..
. .
Temperature
No.
Of Cumulative
Problem Pareto Diagram Percentage
Items
Problem Type
CAUSE AND EFFECT
DIAGRAMS
DESIGNED TO REPRESENT A MEANINGFUL
RELATIONSHIP BETWEEN AN EFFECT AND ALL ITS
POSSIBLE CAUSES.
PICKING UP AND ARRANGING ALL POSSIBLE CAUSES
WITHOUT ANY OMISSIONS
USED TO INVESTIGATE DEFECT CAUSE AS WELL AS TO
INVESTIGATE AN IN-CONTROL PROCESS
ALSO KNOWN AS FISH BONE OR ISHIKAWA DIAGRAM.
CAUSE AND EFFECT
DIAGRAMS
Man Machine
Problem
Main bone or
Effect
Defect %
Production
Blowholes
Size error
hardness
Control Chart
Control chart
UCL
CL
LCL
Control Chart
SPC is defined as the application of statistical
methods to the measurement and analysis of
variation in any process.
Process variations are traceable to two kinds of
causes:
Chance (or random) causes which are inherent
in the process
Assignable (or special) causes which cause
excessive variation.
Control Chart
A process that is operating without
assignable causes of variation is said to be
“in a state of statistical control”.
X bar and R chart
UCL = X ± A2R
LCL = X ± A2R
CL = X
Control Chart
p chart (control chart for defectives)
UCL = p ± 3 * SQRT ( p(1-p)/n)
LCL = p ± 3 * SQRT ( p(1-p)/n)
CL = p
Control Chart
c chart (control chart for defects)
UCL = c + 3 * SQRT (c)
LCL = c - 3 * SQRT ( c)
CL = c
Process Capability
Cp = (USL – LSL)/6
Cpk =
Min (( USL-Mean)/3s, (Mean – LSL)/3s)
For traditional quality company, Cp ≥ 1.33
For six sigma quality company, Cp = 2 and
Cpk = 1.5