Documentos de Académico
Documentos de Profesional
Documentos de Cultura
TM
FDB44N25
250V N-Channel MOSFET
Features
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchilds proprietary, planar stripe,
DMOS technology.
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor
correction.
Fast switching
100% avalanche tested
Improved dv/dt capability
D
{
G{
z
z
Parameter
VDSS
Drain-Source Voltage
ID
Drain Current
IDM
Drain Current
VGSS
Gate-Source voltage
EAS
IAR
Avalanche Current
EAR
dv/dt
PD
Power Dissipation
FDB44N25
Unit
250
44
26.4
A
A
176
30
(Note 2)
2055
mJ
(Note 1)
44
(Note 1)
30.7
mJ
(Note 3)
4.5
V/ns
307
2.45
W
W/C
-55 to +150
300
(Note 1)
(TC = 25C)
- Derate above 25C
TJ, TSTG
TL
Thermal Characteristics
Symbol
Parameter
Min.
Max.
Unit
RJC
--
0.41
C/W
RJA*
--
40
C/W
RJA
--
62.5
C/W
FDB44N25 Rev A
www.fairchildsemi.com
September 2005
Device Marking
Device
Package
Reel Size
Tape Width
Quantity
FDB44N25
FDB44N25TM
D2-PAK
330mm
24mm
800
Electrical Characteristics
Symbol
Parameter
Conditions
Min.
Typ.
Max Units
250
--
--
Off Characteristics
BVDSS
BVDSS
/ TJ
--
0.25
--
V/C
IDSS
---
---
1
10
A
A
IGSSF
--
--
100
nA
IGSSR
--
--
-100
nA
3.0
--
5.0
--
0.058
0.069
--
32
--
--
2210
2870
pF
On Characteristics
VGS(th)
RDS(on)
Static Drain-Source
On-Resistance
gFS
Forward Transconductance
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
--
450
585
pF
--
60
90
pF
--
55
120
ns
Switching Characteristics
td(on)
tr
td(off)
tf
Qg
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
(Note 4, 5)
--
400
810
ns
--
85
180
ns
--
115
240
ns
--
47
61
nC
--
18
--
nC
--
24
--
nC
--
--
44
ISM
--
--
176
VSD
--
--
1.4
trr
--
195
--
ns
Qrr
--
1.8
--
(Note 4)
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 1.7mH, IAS = 44A, VDD = 50V, RG = 25, Starting TJ = 25C
3. ISD 44A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C
4. Pulse Test: Pulse width 300s, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
2
FDB44N25 Rev A
www.fairchildsemi.com
10
10
10
150 C
1
10
25 C
o
-55 C
Notes :
Notes :
10
1. VDS = 40V
2. 250 s Pulse Test
-1
10
10
10
10
10
12
0.125
2
RDS(ON) [ ],
Drain-Source On-Resistance
10
0.100
0.075
VGS = 10V
0.050
VGS = 20V
0.025
Note : T = 25
10
150
25
Notes :
1. VGS = 0V
2. 250 s Pulse Test
0.000
0
25
50
75
100
125
10
150
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
6000
Capacitances [pF]
5000
4000
3000
Coss
Ciss
Note ;
2000
1000
1. VGS = 0 V
2. f = 1 MHz
Crss
VDS = 50V
10
VDS = 125V
VDS = 200V
Note : I = 44A
D
0
-1
10
0
0
10
10
20
30
40
50
60
3
FDB44N25 Rev A
10
www.fairchildsemi.com
1.1
1.0
Notes :
0.9
1. VGS = 0 V
2. ID = 250 A
0.8
-100
-50
50
100
2.5
RDS(ON), (Normalized)
Drain-Source On-Resistance
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
1.2
150
2.0
1.5
1.0
Notes :
0.5
1. VGS = 10 V
2. ID = 22 A
0.0
-100
200
-50
50
100
150
200
10
50
10 s
2
100 s
1 ms
10 ms
100 ms
DC
10
40
10
10
Notes :
o
1. TC = 25 C
-1
10
2. TJ = 150 C
3. Single Pulse
30
20
10
-2
10
10
0
25
10
10
50
75
100
125
150
D = 0 .5
10
-1
0 .2
0 .1
0 .0 5
10
0 .0 2
0 .0 1
-2
N o te s :
1 . Z J C( t) = 0 .4 1
/W M a x .
2 . D u ty F a c to r, D = t 1 /t 2
3 . T J M - T C = P D M * Z J C( t)
PDM
s in g le p u ls e
t1
t2
10
-5
10
-4
10
-3
10
-2
10
-1
10
10
t 1 , S q u a re W a v e P u ls e D u r a tio n [s e c ]
4
FDB44N25 Rev A
www.fairchildsemi.com
VGS
Same Type
as DUT
50K
Qg
200nF
12V
10V
300nF
VDS
VGS
Qgs
Qgd
DUT
3mA
Charge
VDS
RL
VDS
90%
VDD
VGS
RG
VGS
DUT
10V
10%
td(on)
tr
td(off)
t on
tf
t off
BVDSS
1
EAS = ---- L IAS2 -------------------2
BVDSS - VDD
L
VDS
BVDSS
IAS
ID
RG
VDD
tp
tp
5
FDB44N25 Rev A
VDS (t)
VDD
DUT
10V
ID (t)
Time
www.fairchildsemi.com
Preliminary
FDB44N25 250V N-Channel MOSFET
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
dv/dt controlled by RG
ISD controlled by pulse period
10V
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
VSD
VDD
Body Diode
Forward Voltage Drop
6
FDB44N25 Rev A
www.fairchildsemi.com
Mechanical Dimensions
D2-PAK
FDB44N25 Rev A
www.fairchildsemi.com
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx
FAST
ActiveArray
FASTr
Bottomless
FPS
Build it Now
FRFET
CoolFET
GlobalOptoisolator
CROSSVOLT GTO
DOME
HiSeC
EcoSPARK
I2C
E2CMOS
i-Lo
EnSigna
ImpliedDisconnect
FACT
IntelliMAX
FACT Quiet Series
Across the board. Around the world.
The Power Franchise
Programmable Active Droop
ISOPLANAR
LittleFET
MICROCOUPLER
MicroFET
MicroPak
MICROWIRE
MSX
MSXPro
OCX
OCXPro
OPTOLOGIC
OPTOPLANAR
PACMAN
POP
Power247
PowerEdge
PowerSaver
PowerTrench
QFET
QS
QT Optoelectronics
Quiet Series
RapidConfigure
RapidConnect
SerDes
SILENT SWITCHER
SMART START
SPM
Stealth
SuperFET
SuperSOT-3
SuperSOT-6
SuperSOT-8
SyncFET
TinyLogic
TINYOPTO
TruTranslation
UHC
UltraFET
UniFET
VCX
Wire
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production