SIEMENS
Portable Test Set insnalion
‘ype PTS-4 Operation
Maintenance
SG-3138 Table of Contents
INTRODUCTION.
General
Static Tip Caltbation Marks
Restoring Lost Calibration
DESCRIPTION
Description
Rating
Calibration
Construction Details
Control Panel
TESTING STATIC TRIP III Devices.
Testing Static Trip Device on Circuit Breaker
Connections—Use Card Set 18-732-184:508
Long Time Pick-Up Test
‘Short Time Pick Up Test
Ground Pick-Up Test
Instantaneous Pick-Up Test
Long Time Delay Test
Short Time Delay Test
Ground Time Delay Test cee
Bench Testing Static Trip III Devices,
‘TESTING STATIC TRIP II DEVICES
Testing Static Trip Device on Circuit Breakor
Connections—Use Cord Set 18-732-184-506
Long Time Pick-Up Test.
Short Time Pick-Up Test.
Ground Pick-Up Test
Instantaneous Pick-Up Test
Page
10
10
12
13
13
4
14
4
14
Long Time Delay Tost
Short Time Delay Test
Ground Time Delay Test
Bench Testing Static Trip II Devices
‘TESTING FIRST GENERATION TRIP DEVICES.
CConnections—Use Cord Set 18-732-184-506
Test Procedures
Bench Testing
ual Device
‘TESTING LIMITRIP DEVICES.
General
Connections~—Use Cord Set 18-782-184-507
Settings of Bands and Pick Ups
Test—Long Time Pick-Up.
Tost—Short Time Pick Up.
Test—Instantaneous Pick-Up
Test—Long Time Delay
Test-—Short Time Delay
Bench Test—Limitip Devices
COMMENTS ON TEST RESULTS
TESTING THE TRIPPING ACTUATOR
Testing the Actuator on the Circuit Breaker
Bonch Testing Actuators
TESTING THE TRIPPING TRANSFORMERS.
Test Preparations
Continuity Tests
Exciting Current Test ..
REPAIR OF STATIC TRIP DEVICES
18
18
7
18
18
19
25
28
20
28
29
30
30
31
32
32
32
33
33
33
33
36, Introduction
Page 1
General
‘Siemens Energy & Automation portable test set type PTS-4 is
‘designed for testing the stalic overcurrent tripping systems us-
‘edonthe LA and AL line of low voltage power crcut breakers,
It provides a moans of testing the magnetic tripping actuator
as well asthe static trip device. The portable test se, using
power from an ordinary 120 vot convenience outlet, can pro
vide crcut breaker testing equivalent to much more expensive
‘and cumbersome primary current testing.
This instruction book provides the information necessary to test
all models of static vip systems produced by Allis Chalmers,
‘Siemens Alls or Siemens Energy & Automation from the orginal
fist generation models tothe latest versions of STATIC TRIP
Il and LIMITRIP, First generation systems are discussed in
‘more detail in instruction book 18X4392, STATIC TRIP Il in
books 18X4827, 18X4433 and SG-3098, LIMITRIP is covered
in book 18X10107 and SG-3108. STATIC TRIP II in S31 18.
Factory calibration ofthe tip devices is done with sinusoidal
current from a closely regulated supply and with high quality
instruments that are frequently recalibrated. These conditions
‘cannot be dupscated ina portable tester. In parcular, 120 vot
Tne variations during testng may affect resus. Theretore, minor
ciscrepancies between factory calbration and test set readings
can be safely disregarded.
‘The test setitsel is quite accurate and can be used to calibrate
additional pickup and shor ime delay values on the trip devices
if a sufficiently stable 120 vol ine is availabe. The voltage can
'be anywhere between 105and 125 vot, but the value should
not vary by more than + 1.596 during testing,
Static Trip III Calibration Marks
Each static tip of the frst generation or STATIC TRIP IL type,
is individually caltorated during factory test. Because the loca
tion ofthe calibration points varies from device to device, itis
‘not possible to preprint the identification letters adjacent tothe
marks, To identily letter or label with ts calibration dot, start
‘rom the reference dot (see “Restoring Lost Calibration”) and
‘count the calibration dots around the dial in the direction
(clockwise or counterclockwise) indicated by the sequence of
the letters or labels. For example, the "C" LONG TIME PICKUP
dot is the third callbration dot counted clockwise from the
relerence dot. On STATIC TRIP II the direction of counting is.
also the direction indicated by the “increase” arrow.
Restoring Lost Calibration
‘The pointer of each knob when turned counterclockwise against
is stop should line up with its reference dot. (Reference dots
are black on STATIC TRIP Il and red on first generation
‘SHORT TIMEH
Curves «S)
08
= : 06
INS TANTANEGUS
od | PICKUP NALIMUM INTERRUPTING TIME ]Y] 94
t AD.USTHENT_RANGE
245B12 2 15 TIME
‘SENSOR RATING
lee t
ol Lf HEE Pid EE TG
: oz
t
i
Lo
So 2040" 60 80100 2 4 6 Bid 20 ad” 60 80100
GROUND CURRENT IN PERCENT CURRENT IN MULTIPLES
DF GRD. SENSOR RATING OF LONG Time SETTING
Figure 5. Time Current Curves—Static Trip I Testing Static Trip III Devices
Page 10
—_
\When timing at values of current only slighty above
pick-up, ine voltage fluctuations may cause dettigger
ing and result in erroneous operating times. Therelore,
it's advisable to watch the long time pick-up light 0
ote whether tigger vollage is maintained. In. genera,
itis impractical to test time delay at less than 10%
above pickup.
Short Time Delay Test
1, Set LONG TIME CURRENT SETTING .5, LONG TIME
BAND on 30, INSTANTANEOUS PICK-UP "15x," SHORT
TIME PICK-UP on 2X (0.5 Amperes) and SHORT TIME
BAND on MAXIMUM .40.
2. Press the START button and adjust the current to 1 ampere
‘or more. In turn, press the STOP and the RESET buttons.
2. Close the circuit breaker, if desired.
4, Press the START button, the delay should be 35 to 60
seconds. Soe Figure 5.
5, Repeat for SHORT TIME BAND settings on the other delay
‘bands. Compare to Figure 5. The other phase circuits and
déforent values of curent can be tested if desired. Make cur-
rent settings as quickly as possible to avoid overheating,
Ground Time Delay Test
1. Select ground with power boost, STATIC TRIP III GROUND.
2. Set GROUND PICK-UP on’ 20% (0.10 ampere) and
GROUND TIME BAND on “Maximum,” .40,
28, Press the START bution and adjust the current to 0.5 ampere
‘or more. (Erroneous time delay readings and faiture to tip
the circuit breaker or target may ocour at lower values of
current, The wavashape of current from the test set may not
provide enough power to charge the fiter capacitor in the
ltip device before tripping occurs. By running the test at a
higher curent his fect is minimized) In tur press the STOP
and the RESET button,
4. Close the circuit breaker, it desired
5, Press the START button. The breaker should trip in 0.4 and
(0.5 seconds. See Figure 5.
6, Repeat for other GROUND TIME BAND settings and for other
pickup and current settings, i desired. Make current ad-
justments above 1 ampere quickly to avoid oveheating,
Bench Testing
Static Trip III Devices
Connections
With the static tip device away from the circuit breaker itis
necessary to make connections fo the fanning stip ofthe tip
device via the connector supplied. A terminal block is provi
‘ed on the test set to faciitate this connection, The end of the
‘connector strip next to the cord must connect to terminal 1,
2 spacer under one mounting screw of the test set faceplate
provides interference i the connections are made incorrect.
‘The terminal block is connected internally, so the phase selec-
tor switch is used.
Test Procedure
The testing procedures are exactly the same as given in
TESTING THE STATIC TRIP ON THE CIRCUIT BREAKER ex:
cop, of course, any reference tothe circuit breaker is ignored,
‘Some STATIC TRIP II DEVICES may contain circuit functions
that are not completely tested by the relatively simple portable
test set. These are described in the following sections.
Zone Selective Interlock Tests
(On devices withthe Zone Seloctve Interlock solected both the
‘SHORT TIME and the GROUND TIME delay bands are atfected
by the incoming ZSI signal. With no incoming ZS! signal both
time bands will be on their minimum, when an incoming ZSI
signal is present both the SHORT TIME and GROUND delay
‘lernent switch to the band selected by the front panel contol.
‘On devices containing the ZS! funciton, the ZS! output circuit
provides an output signal anytime either the SHORT TIME or
GROUND pick-up values are exceeded.
Both the incoming and outgoing ZS! circuits ae isolated by an
optical isolator inside the device, so some power must be pro-
Vide either externally o¢ by making connections to the trip
devices own power supply
Both sots of signals are brought out on the 15 pin sub
connector.
Pin 1 and 2 are the device negalive power.
Pin 3 is the device + 12 vol power.
Pin 4 is the +5 volts from the target power supply.
Pin 5 is the ZSI pesitve signal input
Pin 6 is the ZSi negative signal input
Pin 7 is the ZSI negative signal output
Pin 8 is the ZSI postive signal output, Testing Static Trip III Devices
Page 11
‘The ZSI output is an isolated transistor that can be checked
with an ohmeter, or by using a dropping resisior and connec:
ting both the devices postive and negative power supply and
detecting turn-on of the transistor with a volimeter. This tan-
sistortuns ON wien ether SHORT TIME or GROUND elements
have picked-up,
‘A resistor of approximately 220 ohms should be used to iit
the current through the transistor during testing. Connect the
resistor trom pin 3 to pin 8, connect pin 7 to pin 1 or 2. Measure
the volage between pins 7 and 8.
To check the operation of the ZS! input circuit set the SHORT
TIME and GROUND TIME BANDS to 40, s0 that a difference
in timing can be detected. Open the SHORT TIME I" SLOPE.
‘switch. Run the time delay test as described previously, then
at the 15 pin connector connect pin 5 to pin 4 and pin 6 to
pin 1 0f 2 and repeat the timing tess. The time delay should
then change to the selected band.
It the slope switch is are closed the incoming ZSI signal wil
rot change the time delays unless the current used in the test
is above the range where the SLOPE circuits affect the delay
Long Time Cool Down Tests (Thermal Memory)
The cool down integrator accumulates the LONG TIME signal
‘and provides a coal down function for the LONG TIME delay.
Closing the thermal memory switch disables the integrator and
allows the long time delay elements to resot whenever the long
time signal drops below pickup. When the thermal memory
‘switch is open the longtime delay elements are not reset when
the signal drops below pickup, but is decreased slowly with
time.
“To check the operation of the circuit set LONG TIME PICK-UP.
on .5 LONG TIME BAND on 1, close the thermal memory
‘witch, Apply 0.5 amperes o one phase input low the device
to time out, record the ime. Open the thermal memory switch
{and repeat the same test, again record the time, it should be
the same as the frst test.
Ropeat the test but this ime momentarily lower the current to
0.15 to 0.2 ampere for approximately 5 seconds every 10
seconds. Be very careful to not drop below 0.15 amperes.
‘Again measure and fecord tripping time, this should be approx
imately the same as for the first two tests. Close the thermal
memory switch and repeat this test, in this case the device
‘should never time out, and it should be possible to continue
the cycle indefinitely
Remote Indicator Output Tests
AIISTATIC TRIP IL trip devices have a nine pin connector on
the front ofthe device to connect to the remote indicator unit.
I the remote indicator s available it can be used to test the
output signals, i there is a malfunction between the two
assembles, substitution of either unit is the best field test to
isolate the defective assembly.
‘The output signal is a four bit, latched, parallel binary word
representing the calculated RMS current in the highest phase
thal is provided to the remote indicator. This word is on pins
2 through Sof the nine pin connector, with the following code:
Current, in Multiples of
Binary Word Switch Long Time Picl
‘0000
000% 1 06x
010 2 07x
ott 3 oax
0100 4 09x
orot 5 1.0X This is Long Time
Pick-Up Current
0110 enix
ont 7 12x
+1000 Be ix
1001 9 14x
‘The connector also contains +5 volts on pin 1 to power the
remote indicator. The negative or common line ison pin 9. Pin
8 is a sgnal called NOT RESET this signal is used to enable
the remote indicator and is +5 vols OC when current above
approximately 100 millamperes is supplied to the trip device,
‘below this input level none of the data is valid, All pins can be
checked with a volimeter, while the current is adjusted as
desired, some dithering of the LED is normal and should be
ignored.
The remote indicator assembly decodes the number and drives
aight emiting diode bar display, to indicate the magnitude
Cf current. The indicator also contains a switch and circuitry
thal selects any one of the current levels indicated and closes
‘a sold state contact when that evel s exceeded. The table sts
the switch marking and the current levels
‘The solid state contactis rated 1 ampere max. 125VDC or AC,
ominal
Itis not necessary to operate the circuit breaker for any static
luip device tess. If is desired to test the operation of the cir
‘cuit breaker, the tests can be run with the crcuit breaker closed
and allowing the trip device to open the breaker. Testing Static Trip II" Devices
Page 12
‘Trip devices can be tested when mounted on a circuit breaker
in the disconnect postion in its cubicle, with the device on a
circuit breaker removed from its cubicle or with the device
separate from the circuit breaker.
‘The folowing instructions cover testing ofall the elements for
the most complicated type of rip device. Other types do not
‘contain al these elements. See the listing and description of
available types in Table 2.
Table 2
tale Tine Sena Sed Hemet
renee camate Pep = cSibaed Pik Up
oe *y]e je yo fe |r] e | fain Sue
TR [sh [som [oe
tom Fane
ne w| 2| »| 7») w| »| m| wm | of « ®
mre
Took Fane
noon am | |] | wl] o| aol | | = | 2| «| mw] aw
mur & | mo] gol wo] ao | a] oo | | o> | o| | am]
ne oo | foo] So | to] Tmo | am] cor| sooo] soo | em | am) | om
TBA Fame
me mm | | | wo] ns | aw] 2s) oo] 0 | 2) | mo) m
mice | so ao | so] so] aml oo) oo] So | a] im| aml ko
muss sn | 300] Soo] goo] 70 | omo| om | som | som | | ao] ao] ao
sto | sm | soo | som | seo | sen0| vom-| Zour] tow | 200 | Sto | amo| 0
730k Fame mr] io} es} ao] os | ao] | mo] |e] | me] ow
me | | go | wm] | a] a | oo] 50 | | so) aol a
rate so | woo | soo | too] Teo | om] soo | som | sooo | sm) am) eo] ow
sao | ato | som | sam | sam | seo | sro | amo 2x0 | 200] S00 | ao0| sooo
S| sooo | feo | too | tr | no | Zo | Zor | 20m | Sto | Sto | sow] 20
ion ames | m0 [0 | Tom | tam | ve | se00] tomo | zo | 2m [20 [soo | amo | i800
mao zoo | som | tom | tom | tr | amo | ze | 2m | 25m | S00 | sto | sto | 200
nurse ano | tom | 120 | tom | zr | fu | arn | Som | Som | 3x0 | oxo | to | 2400
Seto | tom | zoo | zen | Zoo | Sao | Som- | fom | Sem | soo | amo | emo | 200
"oA Fame
mae sa | s6m | zom | 210 | zz | sev0| sow | sow | sow | 20) a0 | x0} amo
murat ‘m__| 250 | Zn | Soon | oo | sao | sou | Som | Som | ero | smo | 20 | demo
* Ereaeds maximum coninvous caret rating of ame—do nt use these seings.
(Breaker may not tip wih this ground fu stig.
‘Long tine element continually agusabe fom A trounh
Types Available
Ten,
TSN:
TSION)
Tuan:
Long Time and Instantaneous.
Long Time and Short Time
Long Time, Short Time and instantaneous
{Long Time and Instantaneous.
TSI2T): Long Time and Short Time
TSIZT): Long Time, Short Time and Instantaneous.
TIG(ST): Same as T(2T), plus Ground Fault
TSG@T) Same as TS(2T), plus Ground Fautt
TSIG(ST) Same as TSI(2T), plus Ground Fault
Devices with (OT) designation do not include targets.
Devices with (21) designation include targets to indicate
overioad trip and short circuit trip, while those with (3T)
| 20| 30 | am | woo | 20 | am | oo
Uciso0 — | 600 | 1000 | saxo | 1400 | tooo io | 20 | a | co | to | a0] a | oo
Uereoo | sooo | 250 | isco | 1780 | zoo 200 | ao | ow | soo | 200 | aon | soo | too
Uasooo | 1200 | 1500 | jaca 2100 | 200 20 | ao | 7 | 60 | 20 | a0 | roo | S00
sooo a0 | 2000 | 2500 | amo fo | ao | 0 | se00 | aco | 300 | 1200 | 1600
000" | 3000 | 2500 | 200 | sso" | sono ‘ao | am | i200 | exo | 0 | 00 | tao | tooo
xsooo | 2000 | 2500 | 2im0| 3500 | sooo ‘to_|_ om | ‘200 | tooo | 400 | 00 | tz | tex
Secon PED? | 050 [ames | o7s [oars | 10 | — | 01 | o2| ow | ow | ow |om| om | ow
“Maximum continoou cunt for LA-GO0 is 600K, LA-1600 is 16008, LA-S000 i 30008, and LA 4000 fs AZNDA Testing First Generation Trip Devices
Page 19
labeled “instantaneaus Trip Setting” (4). The Short Time Pick:
Up sabeled "Tranter to Short Tine (6). There are no test jacks
provided onthe front ofthe device. Connections for trigger in
ication are made to points onthe terminal block as shown in
Figures 9 through 12. (6) On STATIC TRIP Il the knob
reference dots (knob counterclockwise against stop) are black
‘and the calibration dots are red. On frst generation tip devices
the reference dots are red and the calibration dots are black
fon some models and white on others.
NOTE
Once pickup has been veriied, disconnect the
indicators for Time Delay Testing. The indicators can
load the circuit and prevent the trip device from tring
out
Figure 10, Test Connections—Models AG, AGT, AG2,
DG and DGt
Test Procedures
Keeping the above differences in mind and making careful
reference to the appropriate connection ciagram in Figure 9
through 12, the test instructions in Testing Static Trip on the
Breaker” (omiting the connection instructions in each case)
‘can be used for testing first generation trip devices also. Com
pare the test results with Table 3 and Figures 13, 14, 15, 16
and 17 as applicable.
Figure 11. Test Connections—Models 4WAG and 4WOG
| ore
[ Neemay
Figure 9. Test Connections—Modeis A, At, A2, C3,
, 01 and 02
Figure 12. Test Connections—Models C. C1 and C2 Testing First Generation Trip Devices Page 20
‘urrent in mulioles of pickwp
param, 2 a eserso 2 wwe? 8 3 98
B 8 Eeeees-
=
to teers Sw eben f Tene f PEGE
current in malign of pickup wae
Figure 13. Time Current Curves—Models A, Al, A2,
‘AG and AGT Testing First Generation Trip Devices Page 21
current in multiples of pickue
38 8 b8a8
a 8 8 eRe
wowewsrasg 2 8 8 8 888
current in muliples of pichop
Pinner
Figure 14. Time Current Curves—Models D and 01 Testing First Generation Trip Devices Page 22
2 a neneer gg eee Rees ag
B eeeeeg
ee eee eg
y gases eg
e eee tg
TAM NTERRUPTING
me w stems
“cURRENT PERCENT OFA" PRP 333-
a a eases
Figure 15. Time Current Curves—Models A2, A3, D2, DG1,
WAG and 4WOG Testing First Generation Trip Devices Page 23
CURRENT IN MULTIPLES OF PICKUP
12 345 “Ww 20.304050 100 200 300 $00 _1000_2000___3000
5
1000;
800
Min TIME
INTERMEDIATE TIME
200
MAXIMUM. TIME
100!
80
60
40
20
TIME IN SECONDS
os
06
oa
oz
|
< aouustaste — L__ 500-4000 Ye
06 INSTANTANEOUS.
TRIP (TOLERANCE TA
04 210%)
2
S71 a 3 4510 20.30.4080 100 200 300 500
CURRENT IN MULTIPLES OF PICKUP
700 7000-5000
Figure 16. Time Current Curves—Models C, C1 and C2 Testing First Generation Trip Devices Page 24
‘CURRENT IN MULTIPLES OF PICKUP
jo0q2——_-2_3 #3 1 20 30.4080 100 200300 300 1000 2000 8000
‘MINI TIM
INTERMEDIATE TIME
TIME IN SECONDS
$8 _
g
Stes 4 8 20 3040505 “200 300” 8001000 7060 8000
Figure 17. Time Current Curves—Model C3 Testing First Generation Trip Devices
Page 25
Bench Testing
The alligator clips described previously are also used to make
‘connections to the frst generation trp devices for bench testing,
‘80 connections and procedures are the same as when testing
with the device on the circuit breaker.
1. Types
A — Dual Static (fig tine an instantaneous
elements.
c ~ Dual Slate Sloctabe Time Bard and high
range instantaneous.
> = Seiecive Static (ong time and short time
ements)
AG = Dual Static with ground fault element for 3
vite cuits.
0G — Selective Siatic wih ground fut element for
3 wire crcuits
AWAG —— Dual Siac with ground faut element for 4
wire and 3 wir circuits
4WDG — — Selective Siac wi ground tut element for
4 wire and 3 wire circuits.
2, The pickup settings of the instantaneous and short time
delay elements are calibrated at 3, §, 8 and 12 multiples
of the long time delay pick-up seting.
3 The maximum interrupting ime is the maximum length of
time that fault current flows, inctuding arcing time.
4. Instantaneous maximum interrupting time may be greater
‘when breakers are closed in on a fauit depending on ac
tual fait conditions, The maximum potential increase for
123 phase fault i 0.01 seconds and for a single phase
‘ground fault is 0.02 seconds.
5. The lower limit of ground fault recognition is 25 amperes
for an LA-600 breaker. For an LA-1600 breaker the lower
limit is 40 amperes. Application of Models 4WAG and.
4WDG is not recommended for LA-600 breakers having
‘a minimum continuous current setting of less than 75
amperes of an LA-1600 breaker with a minimum con:
tinuous current setting of less than 200 amperes.
Dual Device
MODEL A— general purpose device normally used for phase
overcurrent protection. The pick-up range is selected from the
trip rating table and is continuously adjustable from "A" through
“Ein the field, The instantaneous element is continuously eid
adjustable from 3 to 12 mutiples of the long time delay pick:
Up setings selected. The time delay band is selected and set
at the factory-—itis not field adjustable, Available time delays
are minim, intetmediate and maximum,
MODEL AG (optional) — provides phase overcurrent protec:
tion plus sensitive ground fault overcurrent protection for
systems with phase to-phase loading. Ground current pick-up
setings are independent of the phase pickup settings, and con:
tinuously adjustable inthe field from 2036 through 80% of the
‘minimum phase pick-up setting shown in column “A
MODEL 4WAG (optional) — provides phase overcurrent pro
tection plus senstve ground fault overcurrent protection for 3
wire and 4 wie circuits for systems with phaseto-neutral
loading, Ground current pick-up settings are independent of
the phase pickup settings, and continuously adjustable in the
field from 2096 through 80% of the minimum phase pick-up
setting in column A."
MODEL € (optional) — Dual Static Selectable Time Band and
high range instantaneous.
MODEL D (optional) — an overcurtent trip device which pro-
‘vides time delay tripping onl. tallows field adjustment of long
time delay and pickup and short time delay and pick-up. The
‘continuous adjustment feature allows a setting selection
‘anywhere within calibrated points. The user can adjust the cur
rent at which the device transfers from long te to short time
delay between these limits. Any one of the three shor time delay
‘curves can be chosen to be used with any of the three long
time delay curves.
MODEL DG (optional) — provides phase overcurrent protec:
tion plug sensitive ground fault overcurrent protection for
systems with phase-o-phase loading. Ground current pick-up
seltngs are independent of the phase pick-up settings, and con-
tinuously adjustable inthe field from 20% through 80% of the
‘minimum phase pick-up setting shown in column "A,
MODEL 4WDG (optional) — provides phase overcurrent pro-
tection plus sensitive ground fault overcurrent protection for 3
Wire and 4 wire circuits for systems with phaseto-neutral
loading. Ground current pick-up seltings are independent of
the phase pick-up settings, and continuously adjustable in the
field from 20% through 80% of the minimum phase pickup
setting in column “A.” Testing Limitrip Devices
Page 26
wal be helpful to note certain diferences between Limitrip and
‘Static Trip Hl devices: (1) In the Limirp system, the power supply
and signal transformers are relocated to and combined in the
“Sensor Transformers” mounted on the rear ofthe breaker.
There are two cores in each Sensor Transformer. One core pro-
vides power tothe trip device and the other provides the input
signal. The PTS-4 test sets arranged to provide both an input
signal and power signal for test purposes. Static Trip I device
Contains both power signal transformers. (2) All adjustments
are made wit switches ia place of potentiometer type contro,
{@) Only six long time pick-up settings are provided compared
wih seven setings for Sta Trp I. (4) Only four long time day
bbands are included compared with sic for Static Trip If the
shortest and the longest bands are omitted on Limitip. (6) The
{ground faut tripping option is not available. (6) Instantaneous.
and shor time pick-up settings are switch selectable at 3X, 8X,
8X and 12X as compared to continuously adjustable setings
with calibrated points of 3x, 5X, 8X and 12X for Static Trip TL
(7) Time current curves ae in multiples of pick-up seting rather
than in multiples of pickup current
General
1. The "Tripping XFMR Rating” values represent the peimary
‘value ofthe sensor transformer in amperes. The secondary
value is one ampere.
2. The pick-up saltings ofthe long time element are switch
selectable at calrated points "A" thru "F” as shown in
the rating table,
3. The pick-up settings ofthe instantaneous and short time
delay elements are switch selectable at 3, 6, 8 and 12
multiples of the tong time pick-up setting,
4, The long time element has 4 bands that are switch selec
table. The time delay at 4 muliples of pick-up is as follows:
Band 1—2.25 Seconds Band 3-9 Seconds
Band 2—4.5 Seconds Band 4—18 Seconds
5. The shot time element has 3 time delay bands which are
‘switch selectable (minimum, intermediate and maximum),
6. The maximum interrupting ime is the maximum length of
time that fault current flows, inckuding arcing time.
7. Instantaneous maximum interrupting time may be greater
When breakers are closed in on a faut depending on ac-
tual faut conditions. The maximurn potential increase for
23 phase faut is 0.01 seconds and for a single phase
‘ground fault is 0.02 seconds.
Connections—Use Cord Set
18-732-184-507
The connections forthe Limitrip tip devices are made with an
integral wring harness that terminates directly on the Sensor
transformers on the back of the circuit breaker: To gain access
to these terminals, itis necessary to remove the circuit breaker
‘rom the cubicle.
‘The tip device output leads are connected to the tripping ac-
tuator by quick disconnect “couplers.” To connect the test set
output leads, the couplers are disconnected and jack
‘assembles 18-732-085-501 and 502 are inserted into each of
the lines to the actuator. The test set leads are then plugged
into the jack assembles.
‘The trigger test points re not brought out onthe Limitip device,
80 the pick-up cord set is provided with "Grabbers" to con-
nnect directly to the circuit board inside the device, See
Figure 18 for the correct location ofthe test points. Connect
the red "Grabber" to the long time pick-up test point and the
black “Grabber” to the pick-up common test point. The red
‘banana plug of the cord set connects to the jack assembly on
the red leads ofthe trip device and the black banana plug to
the jack assembly on the black leads of the device.
‘The connections tothe sensor terminals atthe rear of the ci
cuit breaker are made as shown in Figure 19. Totest A phase,
make the folowing cord set banana plug connections at the
terminals ofthe A phase Sensor Transformer: Blue banana plug
into terminal B (power lead), Green banana plug into terminal
G (power lead), Yetow banana plug into terminal ¥ (signal lead),
and the Orange banana plug into terminal O (signal lead). To
test the other phases, move all four banana plugs to the Sen-
‘sor terminals of the phase being tested. Note, on Sensor
transformers rated 2000 amperes and up, itis necessary to
‘disconnect ether the blue or green the lead ftom the transformer
and connect the test set direct to the Limivip device because
the low impedence ofthe power winding may prevent tipping. Testing Limitrip Devices
(Aa tase
Figure 18. Limitrip Circuit Board Showing Test Points
Seey] SES] SET
$669] 6000 600
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Figure 19, Limirip Test Connections
Page 27 Testing Limitrip Devices
Page 28
Settings of Bands and Pick-Ups
PICK-UP and BAND setings are made by closing or opening
‘switches grouped in DIP switch modules for the various func
tions. A switchs closed when itis removed up, depressing the
fend opposite the word open.
The PICK-UP or BAND setting is determined by the closed
switch, in each DIP switch module, FARTHEST AWAY from the
biack highlighted number of letter. The setting of the function
controlled by a module s not affected by the positon (open
oF closed) of other switches in that module closer to the black
highlighted number or letter than the desiced seting. Where
the black highlighted number is the largest number or letter,
the setting is controlled by the LOWEST closed switch (LONG
TIME PICK-UP, LONG TIME BAND, and SHORT TIME PICK-
UP). Where the black highlighted number is the smallest
‘number, the setting is controlled by the HIGHEST closed switch
(INSTANTANEOUS PICK-UP and SHORT TIME BAND). The
device label adjacent fo each switch indicates the setting for
that function iis the farthest closed switch. For example, if
LONG TIME PICK-UP module switch 3 isthe farthest closed
‘switch trom the black highlighted "F," the device is set at"
setting of LONG TIME PICK-UP. I the switches on a module
are all open, the setting will be that indicated by the black
highlighted number.
Use peak responding "All Other Test," forall Limitip testing
Test—Long Time Pick-Up
Itis not necessary to operate the circuit breaker during the trip
device tests, the breaker can be let open,
1. Make all connections as described in the preceding sec-
tion, CONNECTIONS.
2. Set LONG TIME PICK-UP on “A” by closing (depressing)
the numbered end of the LONG TIME PICK-UP switch
labeled Ain the Limitip. Place the rip device test set salec-
lor switch to STATIC TRIP TEST positon. Set the range
switch on LOW. Set the POWER selector switch to
INTERNAL,
3. Turn the test set ON. The red cigs of the meters should
come ON, (the alarm light may turn ON also, press the
STOP—alarm reset button) Press and hold the START and
RESET push buttons.
4. Slowly increase the current by rotating the INTERNAL
POWER CONTROL in a clockwise direction. Increase the
‘current unt the LONG TIME PICK-UP light comes ON; his
should be at 0.5 ampere + 10%. The sampling rate ol the
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