Discover millions of ebooks, audiobooks, and so much more with a free trial

Only $11.99/month after trial. Cancel anytime.

VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability
Ebook625 pages18 hours

VLSI Test Principles and Architectures: Design for Testability

Rating: 4.5 out of 5 stars

4.5/5

()

Read preview

About this ebook

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
LanguageEnglish
Release dateAug 14, 2006
ISBN9780080474793
VLSI Test Principles and Architectures: Design for Testability
Author

Laung-Terng Wang

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Related authors

Related to VLSI Test Principles and Architectures

Related ebooks

Electrical Engineering & Electronics For You

View More

Related articles

Related categories

Reviews for VLSI Test Principles and Architectures

Rating: 4.25 out of 5 stars
4.5/5

4 ratings0 reviews

What did you think?

Tap to rate

Review must be at least 10 words

    Book preview

    VLSI Test Principles and Architectures - Laung-Terng Wang

    Enjoying the preview?
    Page 1 of 1